Large tensile-strain-induced monoclinic M-B phase in BiFeO3 epitaxial thin films on a PrScO3 substrate

Article

关键词: X-RAY;    DIFFRACTION;    BOUNDARIES;   

DOI  :  10.1103/PhysRevB.88.054114

来源: SCIE

【 摘 要 】

Crystal and domain structures, and ferroelectric properties of tensile-strained BiFeO3 epitaxial films grown on orthorhombic (110)(o) PrScO3 substrates were investigated. All films possess a M-B-type monoclinic structure with 109 degrees stripe domains oriented along the [(1) over bar 10](o) direction. For films thicknesses less than similar to 40 nm, the presence of well-ordered domains is proved by the detection of satellite peaks in synchrotron x-ray diffraction studies. For thicker films, only the Bragg reflections from tilted domains were detected. This is attributed to the broader domain size distribution in thicker films. Using planar electrodes, the in-plane polarization of the M-B phase is determined to be similar to 85 mu C/cm(2), which is much larger than that of compressive-strained BiFeO3 films. Our results further reveal that the substrate monoclinic distortion plays an important role in determining the stripe domain formation of the rhombohedral ferroic epitaxial thin films, which sheds light on the problem of understanding elastic domain structure evolution in many other functional oxide thin films as well.

【 授权许可】

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