Magneto-optical studies of the correlation between interface microroughness parameters and the photoluminescence line shape in GaAs/Ga0.7Al0.3As quantum wells

Article

关键词: EXCITON LOCALIZATION;    ROUGHNESS;    SPECTRA;    FIELD;   

DOI  :  10.1103/PhysRevB.60.1519

来源: SCIE

【 摘 要 】

In this work we analyze the relation between the interface microroughness and the full width at half maximum (FWHM) of the photoluminescence (PL) spectra for a GaAs/Ga0.7Al0.3As multiple quantum well (QW) system. We show that, in spite of the complex correlation between the microscopic interface-defects parameters and the QW optical properties, the Singh and Bajaj model [Appl. Phys. Lett. 44, 805 (1984)] provides a good quantitative description of the excitonic PL-FWHM. [S0163-1829(99)01424-1].

【 授权许可】

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