Subwavelength visualization of light in thin film waveguides with photoelectrons

Article

关键词: PHOTOEMISSION ELECTRON-MICROSCOPY;    SURFACE;    PEEM;    PROPAGATION;    ABERRATION;    RESOLUTION;    MIRROR;    LEEM;   

DOI  :  10.1103/PhysRevB.89.195129

来源: SCIE

【 摘 要 】

We report the visualization and quantitative analysis of electromagnetic surface fields at solid surfaces with the potential for lambda/50 resolution. To illustrate this capability, we investigate patterns in two-photon photoemission images of light-diffracting structures in waveguiding, transparent thin films. The obtained micrographs show interference patterns between incident and guided light with a remarkable sensitivity to subwavelength features. We demonstrate that photoemission rates are directly related to the surface field strengths and develop a subwavelength method to calculate the surface fields from optical properties and surface topology based on the two-dimensional Kirchhoff diffraction integral. Calculated images based on this theoretical approach compare favorably to experimental electron micrographs.

【 授权许可】

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