Thermal response of nanoscale cylindrical inclusions of amorphous silica embedded in alpha-quartz | |
Article | |
关键词: ION TRACKS; ELASTIC-CONSTANTS; VITREOUS SILICA; COEFFICIENTS; DOTS; | |
DOI : 10.1103/PhysRevB.90.224108 | |
来源: SCIE |
【 摘 要 】
The thermal response of nanoscale cylindrical inclusions of amorphous SiO2 embedded in crystalline quartz (c-SiO2) is investigated by means of small-angle x-ray scattering. The inclusions are generated by swift heavy-ion irradiation that leads to the formation of amorphous ion tracks along the ion trajectories. During in situ annealing between room temperature and 620 degrees C, we observe an irreversible expansion of the track cylinders followed by a reversible contraction. The reversible elastic response of the tracks can be modeled using the temperature-dependent elastic properties of bulk amorphous and crystalline SiO2 for the inclusions and the matrix, respectively. A high initial interface pressure of the nanocylinders is apparent from the calculations.
【 授权许可】
Free