Scanning tunneling microscopy/spectroscopy studies of two isomers of Ce@C-82 on Si(111)-(7x7) surfaces

Article

关键词: ELECTRONIC-STRUCTURE;    ENDOHEDRAL METALLOFULLERENES;    LA-AT-C-82;    C-60;    SPECTROSCOPY;    MICROSCOPY;    LANTHANUM;    CRYSTAL;    ANION;    FILMS;   

DOI  :  10.1103/PhysRevB.70.235421

来源: SCIE

【 摘 要 】

Scanning tunneling microscopy images for two isomers of Ce@C-82 were observed on Si(111)-(7x7) at 295 K. The Ce@C-82 molecules in the first layer were bound to the Si surfaces, and the motions were frozen even at 295 K. The multilayer of the Ce@C-82 isomer I (Ce@C-82-I) produced a close-packed structure in the surface layer by annealing the Si substrate at 473 K. The distance between the nearest-neighboring molecules was 1.15(4) nm whose value was consistent with that, 1.12 nm, estimated from x-ray diffraction of the Ce@C-82-I crystals. This implies that the close-packed structure is dominated by van der Waals forces, as in crystals of Ce@C-82-I. The internal structure of Ce@C-82-I was observed in the first layer due to a freeze of molecular motion caused by strong interactions between the molecule and the Si adatoms in the surface. Scanning tunneling spectroscopy revealed that the energy gaps for Ce@C-82-I and -II in the first layer opened to gap energies, E-g of 0.7 and 1.0 eV, respectively. This fact suggests that these molecules are semiconductors with smaller value of E-g than those for C-60 and C-70.

【 授权许可】

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