4f excitations in Ce Kondo lattices studied by resonant inelastic x-ray scattering

Article

关键词: POLARIZATION DEPENDENCE;    EMISSION SPECTROSCOPY;    CRYSTAL-GROWTH;    CECU2SI2;    SUPERCONDUCTIVITY;   

DOI  :  10.1103/PhysRevB.93.165134

来源: SCIE

【 摘 要 】

The potential of resonant inelastic soft x-ray scattering to measure 4f crystal electric-field excitation spectra in Ce Kondo lattices has been examined. Spectra have been obtained for several Ce systems and show a well-defined structure determined by crystal-field, spin-orbit, and charge-transfer excitations only. The spectral shapes of the excitation spectra can be well understood in the framework of atomic multiplet calculations. For CeCu2Si2 we found notable disagreement between the inelastic x-ray-scattering spectra and theoretical calculations when using the crystal-field scheme proposed from inelastic neutron scattering. Modified sets of crystal-field parameters yield better agreement. Our results also show that, with the very recent improvements of soft x-ray spectrometers in resolution to below 30 meV at the Ce M-4,M-5 edges, resonant inelastic x-ray scattering could be an ideal tool to determine the crystal-field scheme in Ce Kondo lattices and other rare-earth compounds.

【 授权许可】

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