Multiple energy x-ray holography: Incident-radiation polarization effects

Article

关键词: ELECTRON-EMISSION HOLOGRAPHY;    PHOTOELECTRON DIFFRACTION;    AUGER-ELECTRON;    SCATTERING;    PATTERNS;    IMAGES;    RECONSTRUCTION;    INTENSITIES;    INVERSION;   

DOI  :  10.1103/PhysRevB.56.1529

来源: SCIE

【 摘 要 】

Multiple energy x-ray holography (MEXH) measures both phase and amplitude information for x rays scattered from an incident reference beam, from which three-dimensional atomic images can be directly reconstructed. The angular distribution of the x-ray scattering is highly dependent on the polarization direction via the Thomson scattering cross section. We consider here the effect of incident x-ray polarization on images of Fe atoms reconstructed from theoretical and experimental MEXH data for alpha-Fe2O3(001) (hematite). We also illustrate such polarization effects theoretically in the enhancement of specific atomic structural information of ideal Fe trimers, and a Ge delta-layer buried in Si(001), where the use of different polarization modes and experimental geometries is found to strongly influence atomic images.

【 授权许可】

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