Simulation of dc resistivity data: Questioning critical scaling for the high-T-c copper oxides

Article

关键词: HIGH-TEMPERATURE SUPERCONDUCTORS;    VORTEX-GLASS SUPERCONDUCTIVITY;    CORRELATED DISORDER;    THIN-FILMS;    CRYSTALS;    TRANSITION;    TRANSPORT;    MOTION;    PHASE;    YBA2CU3O7;   

DOI  :  10.1103/PhysRevB.61.3267

来源: SCIE

【 摘 要 】

We simulate de V-l data using Gaussian distributions of depinning currents for the mixed state of a copper-oxide superconductor and subsequently submit the data to a critical scaling analysis. Though the simple model for simulation assumes no phase transition for the vortex matter, the generated data exhibit a collapse matching those in the experimental literature. The resulting would-be critical parameters depend on the simulated sensitivity level, reinforcing doubts concerning the utility of the scaling analysis for these systems.

【 授权许可】

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