Employing soft x-ray resonant magnetic scattering to study domain sizes and anisotropy in Co/Pd multilayers

Article

关键词: SPIN REORIENTATION TRANSITIONS;    ULTRATHIN FERROMAGNETIC-FILMS;    UNIAXIAL FERROMAGNETS;    MICROSCOPY;    MORPHOLOGY;    DICHROISM;    PD/CO;   

DOI  :  10.1103/PhysRevB.94.134413

来源: SCIE

【 摘 要 】

It is demonstrated that themagnetic diffraction pattern of the isotropic disorderedmaze pattern is well described utilizing a gamma distribution of domain sizes in a one-dimensional model. From the analysis, the mean domain size and the shape parameter of the distribution are obtained. The model reveals an average domain size that is significantly different from the value that is determined from the peak position of the structure factor in reciprocal space. As a proof of principle, a wedge-shaped (Co-t angstrom/Pd-10 angstrom) 8 multilayer film, that covers the thickness range of the spin-reorientation transition, has been used. By means of soft x-ray resonant magnetic scattering (XRMS) and imaging techniques the thickness-driven evolution of the magnetic properties of the cobalt layers is explored. It is shown that minute changes of the domain pattern concerning domain size and geometry can be investigated and analyzed due to the high sensitivity and lateral resolution of the XRMS technique. The latter allows for the determination of the magnetic anisotropies of the cobalt layers within a thickness range of a few angstroms.

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