Characterizing random one-dimensional media with an embedded reflector via scattered waves

Article

关键词: INTERNAL-REFLECTION;    SCALING THEORY;    DELAY-TIME;    TRANSMISSION;    RESISTANCE;    DIFFUSION;    FLUCTUATIONS;    LOCALIZATION;    TRANSPORT;    LIGHT;   

DOI  :  10.1103/PhysRevB.104.104204

来源: SCIE

【 摘 要 】

We show in random matrix theory, microwave measurements, and computer simulations that the mean free path of a random medium and the strength and position of an embedded reflector can be determined from radiation scattered by the system. The mean free path and strength of the reflector are determined from the statistics of transmission. The statistics of transmission are independent of the position of the reflector. The reflector's position can be found, however, from the average dwell time for waves incident from one side of the sample.

【 授权许可】

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