In-plane and out-of-plane anisotropic magnetoresistance in Ni80Fe20 thin films

Article

关键词: GRAIN-SIZE;   

DOI  :  10.1103/PhysRevB.56.362

来源: SCIE

【 摘 要 】

The anisotropic magnetoresistance (AMR) has been measured for Ni80Fe20 thin films, with the magnetization vector rotating in the film plane as well as out of the film plane. The out-of-plane (OF) AMR is found to be considerably larger than the in-plane (IF) effect, and strongly dependent on the degree of texture. In untextured films, the difference between the IP- and the OP-AMR is explained in terms of a dimensionality effect, whereas in (111)-textured films an additional contribution to the OP-AMR is found.

【 授权许可】

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