Interface characterization of Co2MnGe/Rh2CuSn Heusler multilayers

Article

关键词: HALF-METALLIC FERROMAGNETS;    RAY CIRCULAR-DICHROISM;    BAND-STRUCTURE;    MAGNETORESISTANCE;    DISORDER;    ELEMENTS;   

DOI  :  10.1103/PhysRevB.88.134407

来源: SCIE

【 摘 要 】

To address the amount of disorder and interface diffusion induced by annealing, all-Heusler multilayer structures, consisting of ferromagnetic Co2MnGe and nonmagnetic Rh2CuSn layers of varying thicknesses, have been investigated by means of hard x-ray photoelectron spectroscopy and x-ray magnetic circular dichroism. We find evidence for a 4 angstrom thick magnetically dead layer that, together with the identified interlayer diffusion, are likely reasons for the unexpectedly small magnetoresistance found for current-perpendicular-to-plane giant magnetoresistance devices based on this all-Heusler system. We find that diffusion begins already at comparably low temperatures between 200 and 250 degrees C, where Mn appears to be most prone to diffusion.

【 授权许可】

Free