Three-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theory

Article

关键词: TIP-SAMPLE INTERACTION;    ATOMIC-FORCE;    DISTANCE DEPENDENCE;    SHORT-RANGE;    RESOLUTION;    SENSOR;    FILMS;    OXIDE;   

DOI  :  10.1103/PhysRevB.83.195435

来源: SCIE

【 摘 要 】

The measurand in dynamic force microscopy is the frequency shift, which is a direct function of the tip-sample interaction. In this work, this interaction is experimentally investigated in the parameter space of tip-sample distance and bias voltage. This three-dimensional database is theoretically described by a simple model of a Lennard-Jones potential superimposed with an electrostatic potential. The detailed study of the tip-sample interaction is essential for many scanning probe measurements and offers insight, e. g., into charge states of defects which are supposed to dominate the surface chemistry of many materials.

【 授权许可】

Free