Two dynamic modes to streamline challenging atomic force microscopy measurements

Beilstein Journal of Nanotechnology

article

Alexei G. Temiryazev¹  Andrey V. Krayev²  Marina P. Temiryazeva¹ 

[1] Kotel’nikov Institute of Radioengineering and Electronics of RAS, Fryazino Branch, Vvedensky Square 1;Horiba Instruments Inc.

关键词: atomic force microscopy;    dissipation mode;    scanning probemicroscopy;    vertical mode;   

DOI  :  10.3762/bjnano.12.90

学科分类：环境监测和分析

来源: Beilstein - Institut zur Foerderung der Chemischen Wissenschaften

【 摘 要 】

The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choiceof scanning parameters is quite complicated, since it requires taking into account many factors and finding the optimal balance between them. A researcher’s task can be significantly simplified by introducing new scanning techniques. Two such techniques aredescribed: vertical and dissipation modes. Significantly simplified and formalized choice of the imaging parameters in these modesallows addressing a wide range of formerly challenging tasks – from scanning rough samples with high aspect ratio features to molecular resolution imaging.

【 授权许可】

CC BY