期刊论文详细信息
IET Smart Grid
Smart protection system for identification and localisation of faults in multi-terminal DC microgrid
1  Kalpana Chauhan2  Rajeev Kumar Chauhan3 
[1] ;Central University of Haryana;Dayalbagh Educational Institute;
关键词: power distribution protection;    power distribution faults;    fault currents;    short-circuit currents;    distributed power generation;    fault location;    power generation faults;    power generation protection;    power generation reliability;    power distribution reliability;    electric sensing devices;    electric current measurement;    smart protection system;    multiterminal dc microgrid;    ac systems;    high magnitude fault currents;    dc link;    protection scheme;    low resistance earth fault;    faulted section;    ring main dc bus system;    current sensors;    dc bus segments;    short-circuit current;    fault location scheme;    faults resistance;    fault identification;    fault localisation;    distributed generation;    entering current monitoring;    outgoing current monitoring;    insulated-gate bipolar transistors;    circuit breakers;    computer simulation;   
DOI  :  10.1049/iet-stg.2019.0315
来源: DOAJ
【 摘 要 】

DC microgrid provides the horizontal infrastructures to integrate distributed generation (DG) and loads. Unlike traditional AC systems, DC systems cannot survive or sustain high magnitude fault currents. It makes locating faults very difficult. The conventional protection techniques completely de-energies the DC link in the DC microgrid. A new protection scheme for multi-terminal DC microgrid against line-to-line fault and the low resistance earth fault is presented in this study. The scheme isolates the faulted section from the DC microgrid. Healthy sections are operated without any disturbance and supply continuity is maintained in a ring main DC bus system. The current sensors are mounted at DC bus segments to monitor the entering and outgoing current at different nodes. Further, the current sensors are also mounted at both ends of service mains to monitor their current difference at both ends of the service mains. The controller detects this current difference and opens circuit breakers. To meet the requirement of fast interrupting time and high short-circuit current withstanding capability, insulated-gate bipolar transistors used as circuit breakers. The fault location scheme gives the fault location in various sections (service mains) and faults resistance in the microgrid. The proposed concepts have been verified by computer simulation.

【 授权许可】

Unknown   

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