Angular X-ray cross-correlation analysis applied to the scattering data in 3D reciprocal space from a single crystal

IUCrJ

Andrei V. Petukhov¹  Janne-Mieke Meijer²  Ivan A. Vartanyants³  Dmitry Lapkin³  Anatoly Shabalin³  Michael Sprung³  Ruslan Kurta⁴ 

[1] Debye Institute for Nanomaterials Science, Utrecht University, Utrecht 3584 CS, The Netherlands;Department of Applied Physics and Institute for Complex Molecular Systems, Eindhoven University of Technology, Eindhoven 5600 MB, The Netherlands;Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany;European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany;

关键词: x-ray scattering;    x-ray cross-correlation analysis;    structure determination;    crystalline defects;   

DOI  :  10.1107/S2052252522004250

来源: DOAJ

【 摘 要 】

An application of angular X-ray cross-correlation analysis (AXCCA) to the scattered intensity distribution measured in 3D reciprocal space from a single-crystalline sample is proposed in this work. Contrary to the conventional application of AXCCA, when averaging over many 2D diffraction patterns collected from different randomly oriented samples is required, the proposed approach provides an insight into the structure of a single specimen. This is particularly useful in studies of defect-rich samples that are unlikely to have the same structure. The application of the method is shown on an example of a qualitative structure determination of a colloidal crystal from simulated as well as experimentally measured 3D scattered intensity distributions.

【 授权许可】

Unknown