Direct-push techniques applied to high-resolution lithostratigraphic characterization in alluvial environment

Revista Águas Subterrâneas

Marco Aurélio Zequim Pede¹  Leandro Gomes de Freitas²  Hung Kiang Chang³ 

[1]Fundação para o Desenvolvimento da UNESP -FUNDUNESP/ BOLSISTA

[2]IPT - Instituto de Pesquisas Tecnológicas do Estado de SP

[3]Universidade Estadual Paulista Júlio de Mesquita Filho, UNESP/ Professor Titular

关键词: Direct Push.Caracterização litoestratigráfica.Investigação de alta resolução.Áreas contaminadas.Ambiente aluvionar.;   

DOI  :  10.14295/ras.v31i4.28902

来源: DOAJ

【 摘 要 】

The application of high resolution characterization tools, based on Direct Push methods, for the lithostratigraphic assessment of contaminated sites, has made it possible to obtain more consistent conceptual models. To evaluate the application of these techniques in alluvial environments, the USP Leste campus, located in São Paulo, was chosen for the present study. Three field techniques were analyzed: electrical conductivity (EC) of the MIP probe, Soil Color Optical Screening Tool (SCOST), and soil sampling with Dual Tube system. Additionally, laboratory procedures were adopted for grain size and organic matter content analyses of the soil samples. The profiles obtained with the MIP and SCOST showed a good qualitative correlation with the lithological descriptions and with the granulometric profiles, improving the lithostratigraphic characterization. Organic matter profile analysis showed presence of high organic content and high methanogenic potential layers, especially in the organic clay and silt layers of the Quaternary sediments. The Direct Push techniques demonstrated great potential for high resolution lithostratigraphic characterization of alluvial environments.

【 授权许可】

Unknown