The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates

Nanoscale Research Letters

Longlong Wang¹  Yi Liu¹  Shuai Li¹  Yafang Shi¹  Xiaohui Zhao¹  Xiaoli Li¹  Xiaofen Qiao² 

[1] National-Local Joint Engineering Laboratory of New Energy Photoelectric Devices, College of Physics Science & Technology, Hebei University;State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences;

关键词: MoS2;    ReS2;    Reflection spectra;    Polarization angle;    Anisotropic material;    Isotropic material;   

DOI  :  10.1186/s11671-020-3280-8

来源: DOAJ

【 摘 要 】

Abstract MoS2 and ReS2 are typical transition metal chalcogenides with many excellent electrical and optical properties. Due to different lattice symmetries, ReS2 offers one more dimension than MoS2 to tune its physical properties. In this paper, we studied the polarized reflection spectra in single-layer MoS2 and ReS2. The explicit difference identifies strong angle-dependent properties in single-layer ReS2 distinct from single-layer MoS2. The results of samples on both SiO2/Si substrate and quartz substrate show single-layer ReS2 is in-plane anisotropic and the change period of reflection intensity is estimated with the polarization angles.

【 授权许可】

Unknown