Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

Materials

Mohamed Abdel-Rahman¹  AhmedFauzi Abas¹  Esam Bahidra¹ 

[1] Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia;

关键词: vanadium sesquioxide;    thin film;    thermo-optic coefficient;    infrared ellipsometry;    optical constants;   

DOI  :  10.3390/ma13082002

来源: DOAJ

【 摘 要 】

In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxide thin films at temperatures ranging from 25 °C to 65 °C. High thermo-optic coefficients (dn/dTs) were observed. The highest dn/dTs, measured at approximately 40 °C, were −8.4 × 10⁻³/°C and −1.05 × 10⁻²/°C at 1550 nm and 2000 nm, respectively.

【 授权许可】

Unknown