Boundaries of the X Phases in Sb–Te and Bi–Te Binary Alloy Systems

Crystals

Toshiyuki Matsunaga¹  Kouichi Kifune²  Yoshiki Kubota³  Takuya Wakiyama³  Hiroki Kanaya³ 

[1] Department of Materials Science &Hiroshima Institute of Technology, Faculty of Engineering, 2-1-1 Miyake, Saeki-ku, Hiroshima 731-5193, Japan;Osaka Prefecture University, Graduate School of Science, Osaka 599-8531, Japan;

关键词: binary alloy;    phase diagram;    X-ray diffraction;    superlattice;   

DOI  :  10.3390/cryst9090447

来源: DOAJ

【 摘 要 】

Sb−Te and Bi−Te compounds are key components of thermoelectric or phase change recording devices. These two binary systems form commensurately/incommensurately modulated long-period layer stacking structures known as homologous phases that comprise discrete intermetallic compounds and X phases. In the latter, the homologous structures are not discrete but rather appear continuously with varying stacking periods that depend on the binary composition. However, the regions over which these X phases exist have not yet been clarified. In this study, precise synchrotron X-ray diffraction analyses of various specimens were conducted. The results demonstrate that the X phase regions are located between Sb₂₀Te₃ and Sb₅Te₆ in the Sb−Te system and between Bi₈Te₃ and Bi₄Te₅ in the Bi−Te system.

【 授权许可】

Unknown