TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux

Journal of Materials Research and Technology

Elchin Huseynov¹  Adil Garibov¹  Ravan Mehdiyeva² 

[1] Department of Nanotechnology and Radiation Material Science, National Nuclear Research Center, Baku, Azerbaijan;Institute of Radiation Problems of Azerbaijan National Academy of Sciences, Baku, Azerbaijan;

关键词: Nano SiO2;    TEM;    SEM;    Neutron irradiation;    Nanopowder;   

DOI  :  10.1016/j.jmrt.2015.11.001

来源: DOAJ

【 摘 要 】

Before and after neutron irradiation, in order to identify the “adhesion” in silica nanoparticles, analyses have been conducted on transmission electron microscope (TEM) at small nano dimensions. Simultaneously, at relatively larger nano dimensions, the surfaces of the samples were observed by the scanning electron microscope (SEM). Moreover, analyses of the samples with SAED (selected area electron diffraction) technology on TEM device used for determining the structure of the nanomaterial. From TEM analyses, it has been found that little “adhesion” is observed at small dimensions (maximum 70 nm) under the influence of neutron irradiation and this “adhesion” directly influences the electrophysical properties of nanomaterials.

【 授权许可】

Unknown