IEEE Journal of the Electron Devices Society | |
High Performance |
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Marko J. Tadjer1  James C. Culbertson1  Mengwei Si2  Sami Alajlouni2  Ali Shakouri2  Hagyoul Bae2  Peide D. Ye2  Jinhyun Noh2  Hong Zhou2  Peter A. Bermel2  | |
[1] Electronics Science and Technology Division, United States Naval Research Laboratory, Washington, DC, USA;School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA; | |
关键词: β-Ga₂O₃FET; diamond; nano-membrane; thermal conductivity; self-heating effect; | |
DOI : 10.1109/JEDS.2019.2933369 | |
来源: DOAJ |
【 摘 要 】
To suppress severe self-heating under high power density, we herein demonstrate top-gate nano-membrane β-gallium oxide (β-Ga2O3) field effect transistors on a high thermal conductivity diamond substrate. The devices exhibit enhanced performance, with a record high maximum drain current of 980 mA/mm for top-gate β-Ga2O3 field effect transistors and 60% less temperature increase from reduced self-heating, compared to the device on a sapphire substrate operating under identical power density. With improved heat dissipation, β-Ga2O3 field effect transistors on a diamond substrate are validated using an ultrafast high-resolution thermoreflectance imaging technique, Raman thermography, and thermal simulations.
【 授权许可】
Unknown