期刊论文详细信息
| Modern Electronic Materials | |
| High resolution X-ray diffraction study of proton irradiated silicon crystals | |
| 关键词: Silicon; H+ implantation; Annealing; High-resolution X-ray diffractometry; | |
| DOI : 10.1016/j.moem.2016.08.005 | |
| 来源: DOAJ | |
【 授权许可】
Unknown