Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy

Nanomaterials

Xuqing Sun¹  Hongyao Liu¹  Xinchao Lu¹  Chengjun Huang¹  Ruxue Wei¹  Chang Wang¹  Liwen Jiang¹  Xue Wang¹ 

[1] Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China;

关键词: total internal reflection;    evanescent waves;    leakage radiation;    nanoparticles;    label-free imaging;    microscopy;   

DOI  :  10.3390/nano10040615

来源: DOAJ

【 摘 要 】

Label-free, fast, and single nanoparticle detection is demanded for the in situ monitoring of nano-pollutants in the environment, which have potential toxic effects on human health. We present the label-free imaging of single nanoparticles by using total internal reflection (TIR)-based leakage radiation microscopy. We illustrate the imaging of both single polystyrene (PS) and Au nanospheres with diameters as low as 100 and 30 nm, respectively. As both far-field imaging and simulated near-field electric field intensity distribution at the interface showed the same characteristics, i.e., the localized enhancement and interference of TIR evanescent waves, we confirmed the leakage radiation, transforming the near-field distribution to far-field for fast imaging. The localized enhancement of single PS and Au nanospheres were compared. We also illustrate the TIR-based leakage radiation imaging of single polystyrene nanospheres with different incident polarizations. The TIR-based leakage radiation microscopy method is a competitive alternative for the fast, in situ, label-free imaging of nano-pollutants.

【 授权许可】

Unknown