Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure

Sensors

Bin Liu¹  Shengpeng Wan¹  Tao Wu¹  Juan Liu¹  Jinghua Sun²  Zheyu Wu³  Jiangfeng Zhu³ 

[1] National Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, China;Sch Elect Engn & Intelligentizat, Dongguan University of Technology, Dongguan 523808, China;School of Physics and Optoelectronic Engineering, Xidian University, Xi’an 710071, China;

关键词: optical fiber sensing;    hollow core optical fiber;    graphene oxide (GO);    thickness measurement;   

DOI  :  10.3390/s20072035

来源: DOAJ

【 摘 要 】

An ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF–HCF–SMF fiber structure can measure coating thickness down to sub-nanometers. An experimental study was carried out by coating a thin layer of graphene oxide (GO) on the HCF surface of the fabricated SMF–HCF–SMF fiber structure. The experimental results show that the fiber sensor structure can detect a thin layer with a thickness down to 0.21 nanometers, which agrees well with the simulation results. The proposed sensing technology has the advantages of simple configuration, ease of fabrication, low cost, high resolution, and good repeatability, which offer great potential for practical thickness measurement applications.

【 授权许可】

Unknown