| Electronics | |
| Dynamic and Static Calibration of Ultra-Low-Voltage, Digital-Based Operational Transconductance Amplifiers | |
| Paolo Crovetti1  Pedro Toledo1  Sergio Bampi2  Hamilton Klimach2  | |
| [1] Department of Electronics and Telecommunications (DET), Politecnico di Torino, 10129 Turin, Italy;Graduate Program in Microelectronics (PGMICRO), Federal University of Rio Grande do Sul, 91501-970 Porto Alegre, Brazil; | |
| 关键词: ultra-low-voltage; operational transconductance amplifier (OTA); digital-based OTA (DB-OTA); fully-digital design; dynamic calibration; static calibration; | |
| DOI : 10.3390/electronics9060983 | |
| 来源: DOAJ | |
【 摘 要 】
The calibration of the effects of process variations and device mismatch in Ultra Low Voltage (ULV) Digital-Based Operational Transconductance Amplifiers (DB-OTAs) is addressed in this paper. For this purpose, two dynamic calibration techniques, intended to dynamically vary the effective strength of critical gates by different modulation strategies, i.e., Digital Pulse Width Modulation (DPWM) and Dyadic Digital Pulse Modulation (DDPM), are explored and compared to classic static calibration. The effectiveness of the calibration approaches as a mean to recover acceptable performance in non-functional samples is verified by Monte-Carlo (MC) post-layout simulations performed on a 300 mV power supply, nW-power DB-OTA in 180 nm CMOS. Based on the same MC post-layout simulations, the impact of each calibration strategy on silicon area, power consumption, and OTA performance is discussed.
【 授权许可】
Unknown