Single crystals of bismuth silicon oxide grown by the Czochralski technique and their characterisation

Journal of the Serbian Chemical Society

关键词: bismuth silicon oxide single crystals;    Czochralski technique;    critical diameter;    ciritical rate of rotation;    etching solution;    optical properties;   

DOI  :  

来源: DOAJ

【 摘 要 】

Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. The optical properties of the bismuth silicon oxide single crystals were investigated. The obtained results are discussed and compared with published data.

【 授权许可】

Unknown