Gradient Estimator-Based Amplitude Estimation for Dynamic Mode Atomic Force Microscopy: Small-Signal Modeling and Tuning

Sensors

Hafiz Ahmed¹  Mohamed Benbouzid² 

[1] School of Mechanical, Aerospace and Automotive Engineering, Coventry University, The Futures Institute, Coventry CV1 2TL, UK;University of Brest, UMR CNRS 6027 IRDL, 29238 Brest, France;

关键词: amplitude estimation;    gradient estimator;    small-signal modeling;    atomic force microscopy;    sensor signal processing;   

DOI  :  10.3390/s20092703

来源: DOAJ

【 摘 要 】

Atomic force microscopy (AFM) plays an important role in nanoscale imaging application. AFM works by oscillating a microcantilever on the surface of the sample being scanned. In this process, estimating the amplitude of the cantilever deflection signal plays an important role in characterizing the topography of the surface. Existing approaches on this topic either have slow dynamic response e.g., lock-in-amplifier or high computational complexity e.g., Kalman filter. In this context, gradient estimator can be considered as a trade-off between fast dynamic response and high computational complexity. However, no constructive tuning rule is available in the literature for gradient estimator. In this paper, we consider small-signal modeling and tuning of gradient estimator. The proposed approach greatly simplifies the tuning procedure. Numerical simulation and experimental results are provided to demonstrate the suitability of the proposed tuning procedure.

【 授权许可】

Unknown