Chemical State Mapping of p/n-Controlled SrB6 Bulk Specimens by Soft X-ray Emission Electron Microscope

Applied Sciences

Masatoshi Takeda¹  Yohei K. Sato²  Masami Terauchi² 

[1] Department of Mechanical Engineering, Nagaoka University of Technology, 1603–1 Kamitomioka, Nagaoka 940-2188, Japan;Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2–1–1 Katahira, Aoba-ku, Sendai 980-8577, Japan;

关键词: soft X-ray emission spectroscopy microscope;    chemical shift map;    hole-doping;    elemental map;    spectrum imaging;   

DOI  :  10.3390/app11209588

来源: DOAJ

【 摘 要 】

Elemental and chemical state maps of p/n-controlled SrB₆ bulk specimens are presented by using a soft X-ray emission spectroscopy electron microscope. Those bulk specimens were obtained by sintering powder specimens, prepared by the molten-salt method with different compositions of initial materials. A Sr-map, a chemical shift map of B K-emission, and the spectra of characteristic regions of those materials were compared. It was observed that a local Sr deficiency caused a local hole-doped region, confirmed by a chemical shift in the B K-emission spectrum. n-type SrB₆ was rather homogeneous. On the other hand, the p-type SrB₆ bulk specimen was a mixture of two different p-type regions. This mixed nature originated, presumably, from an uneven Sr content of SrB₆ particles prepared by the molten-salt method using a Sr-deficient starting material. A separation process of the two types of materials will realize a high-quality homogeneous p-type SrB₆ bulk specimens.

【 授权许可】

Unknown