Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Applied Sciences

Chris E. Finlayson¹  John J. Tomes¹  Giselle Rosetta¹ 

[1] Department of Physics, Prifysgol Aberystwyth University, Aberystwyth SY23 3BZ, UK;

关键词: ellipsometry;    structural color;    opal;    polymers;    optical modelling;   

DOI  :  10.3390/app12104888

来源: DOAJ

【 摘 要 】

The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.

【 授权许可】

Unknown