Error Assessment and Mitigation Methods in Transient Radar Method

Sensors

JohanH. Stiens¹  Ali Pourkazemi¹  Salar Tayebi¹ 

[1] Department of Electronics and Informatics, Vrije Universiteit Brussel, Pleinlaan 2, BE-1050 Brussels, Belgium;

关键词: blind method/algorithm;    electromagnetic wave;    geometric and electromagnetic characteristics;    multilayer structures;    sub-wavelength thickness measurements;    non-destructive testing;    non-metallic;    lossy-lossy interface;   

DOI  :  10.3390/s20010263

来源: DOAJ

【 摘 要 】

Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around $\lambda /5$ .

【 授权许可】

Unknown