In Situ Electric-Field Study of Surface Effects in Domain Engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Relaxor Crystals by Grazing Incidence Diffraction

Crystals

SamE. Lofland¹  MarkysG. Cain²  Yves Kayser³  Burkhard Beckhoff³  Peter Finkel⁴  Margo Staruch⁴  Paul Thompson⁵  Christopher Lucas⁵  Didier Wermeille⁵ 

[1] Department of Physics, Rowan University, Glassboro, NJ 08028-1701, USA;Electrosciences Ltd., Farnham GU9 9QT, UK;Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin, Germany;US Naval Research Laboratory, Washington, DC 02375, USA;XMaS Beamline, European Synchrotron Radiation Facility, F-38043 Grenoble, France;

关键词: piezoelectric;    single crystal;    sonar;    characterisation;    X-ray diffraction;   

DOI  :  10.3390/cryst10090728

来源: DOAJ

【 摘 要 】

In this work, we present a grazing incidence X-ray diffraction study of the surface of a 0.24Pb(In_1/2Nb_1/2)O₃-Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ (PIN-PMN-PT) [011] poled rhombohedral single crystal. The near surface microstructure (the top several tens to hundreds of unit cells) was measured in situ under an applied electric field. The strains calculated from the change in lattice parameters have been compared to the macroscopic strain measured with a strain gauge affixed to the sample surface. The depth dependence of the electrostrain at the crystal surface was investigated as a function of temperature. The analysis revealed hidden sweet spots featuring unusually high strains that were observed as a function of depth, temperature and orientation of the lattice planes.

【 授权许可】

Unknown