Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

Polymers

Evgeny Zhuravlev¹  Rui Zhang¹  Christoph Schick¹  René Androsch² 

[1] Institute of Physics and Competence Centre CALOR, University of Rostock, 18051 Rostock, Germany;Interdisciplinary Center for Transfer-oriented Research in Natural Sciences (IWE TFN), Martin Luther University Halle-Wittenberg, 06099 Halle/Saale, Germany;

关键词: Fast Scanning Calorimetry (FSC);    Atomic Force Microscopy (AFM);    polymer morphology;    crystal nucleation and growth;   

DOI  :  10.3390/polym11050890

来源: DOAJ

【 摘 要 】

A chip-based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micrometers to nanometers after fast thermal treatments becomes accessible. An FSC can treat the sample isothermally or at heating and cooling rates up to 1 MK/s. The short response time of the FSC in the order of milliseconds enables rapid changes from scanning to isothermal modes and vice versa. Additionally, FSC provides crystallization/melting curves of the sample just imaged by AFM. We describe a combined AFM-FSC device, where the AFM sample holder is replaced by the FSC chip-sensor. The sample can be repeatedly annealed at pre-defined temperatures and times and the AFM images can be taken from exactly the same spot of the sample. The AFM-FSC combination is used for the investigation of crystallization of polyamide 66 (PA 66), poly(ether ether ketone) (PEEK), poly(butylene terephthalate) (PBT) and poly(ε-caprolactone) (PCL).

【 授权许可】

Unknown