Light-Sheet Microscopy for Surface Topography Measurements and Quantitative Analysis

Sensors

Yang Guo¹  Erik Forsberg¹  Zhanpeng Xu¹  Sailing He¹  Fuhong Cai² 

[1] Centre for Optical and Electromagnetic Research, National Engineering Research Center for Optical Instruments, Zhejiang Provincial Key Laboratory for Sensing Technologies, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310058, China;School of Biomedical Engineering, Hainan University, Haikou 570228, China;

关键词: light-sheet microscopy (LSM);    laser triangulation;    surface topography;    line scanning;    3D reconstruction;    quantitative analysis;   

DOI  :  10.3390/s20102842

来源: DOAJ

【 摘 要 】

A novel light-sheet microscopy (LSM) system that uses the laser triangulation method to quantitatively calculate and analyze the surface topography of opaque samples is discussed. A spatial resolution of at least 10 μm in z-direction, 10 μm in x-direction and 25 μm in y-direction with a large field-of-view (FOV) is achieved. A set of sample measurements that verify the system′s functionality in various applications are presented. The system has a simple mechanical structure, such that the spatial resolution is easily improved by replacement of the objective, and a linear calibration formula, which enables convenient system calibration. As implemented, the system has strong potential for, e.g., industrial sample line inspections, however, since the method utilizes reflected/scattered light, it also has the potential for three-dimensional analysis of translucent and layered structures.

【 授权许可】

Unknown