Applied Sciences | |
Recent Advances in Ultrafast Structural Techniques | |
Germán Sciaini1  | |
[1] The Ultrafast Electron Imaging Lab (UeIL), Department of Chemistry and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, ON N2L 3G1, Canada; | |
关键词: femtosecond X-ray diffraction; femtosecond electron diffraction; synchrotron radiation; laser slicing; X-ray plasma sources; X-ray free electron lasers; XFEL; ultrafast structural dynamics; ultrafast imaging; ultrafast diffraction; | |
DOI : 10.3390/app9071427 | |
来源: DOAJ |
【 摘 要 】
A review that summarizes the most recent technological developments in the field of ultrafast structural dynamics with focus on the use of ultrashort X-ray and electron pulses follows. Atomistic views of chemical processes and phase transformations have long been the exclusive domain of computer simulators. The advent of femtosecond (fs) hard X-ray and fs-electron diffraction techniques made it possible to bring such a level of scrutiny to the experimental area. The following review article provides a summary of the main ultrafast techniques that enabled the generation of atomically resolved movies utilizing ultrashort X-ray and electron pulses. Recent advances are discussed with emphasis on synchrotron-based methods, tabletop fs-X-ray plasma sources, ultrabright fs-electron diffractometers, and timing techniques developed to further improve the temporal resolution and fully exploit the use of intense and ultrashort X-ray free electron laser (XFEL) pulses.
【 授权许可】
Unknown