Recent Advances in Ultrafast Structural Techniques

Applied Sciences

Germán Sciaini¹ 

[1] The Ultrafast Electron Imaging Lab (UeIL), Department of Chemistry and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, ON N2L 3G1, Canada;

关键词: femtosecond X-ray diffraction;    femtosecond electron diffraction;    synchrotron radiation;    laser slicing;    X-ray plasma sources;    X-ray free electron lasers;    XFEL;    ultrafast structural dynamics;    ultrafast imaging;    ultrafast diffraction;   

DOI  :  10.3390/app9071427

来源: DOAJ

【 摘 要 】

A review that summarizes the most recent technological developments in the field of ultrafast structural dynamics with focus on the use of ultrashort X-ray and electron pulses follows. Atomistic views of chemical processes and phase transformations have long been the exclusive domain of computer simulators. The advent of femtosecond (fs) hard X-ray and fs-electron diffraction techniques made it possible to bring such a level of scrutiny to the experimental area. The following review article provides a summary of the main ultrafast techniques that enabled the generation of atomically resolved movies utilizing ultrashort X-ray and electron pulses. Recent advances are discussed with emphasis on synchrotron-based methods, tabletop fs-X-ray plasma sources, ultrabright fs-electron diffractometers, and timing techniques developed to further improve the temporal resolution and fully exploit the use of intense and ultrashort X-ray free electron laser (XFEL) pulses.

【 授权许可】

Unknown