Metric Embedding Learning on Multi-Directional Projections

Algorithms

Gábor Kertész¹ 

[1] John von Neumann Faculty of Informatics, Obuda University, 1034 Budapest, Bécsi út 96b, Hungary;

关键词: deep metric learning;    one-shot learning;    multi-directional image projections;    object matching;    object re-identification;   

DOI  :  10.3390/a13060133

来源: DOAJ

【 摘 要 】

Image based instance recognition is a difficult problem, in some cases even for the human eye. While latest developments in computer vision—mostly driven by deep learning—have shown that high performance models for classification or categorization can be engineered, the problem of discriminating similar objects with a low number of samples remain challenging. Advances from multi-class classification are applied for object matching problems, as the feature extraction techniques are the same; nature-inspired multi-layered convolutional nets learn the representations, and the output of such a model maps them to a multidimensional encoding space. A metric based loss brings same instance embeddings close to each other. While these solutions achieve high classification performance, low efficiency is caused by memory cost of high parameter number, which is in a relationship with input image size. Upon shrinking the input, the model requires less trainable parameters, while performance decreases. This drawback is tackled by using compressed feature extraction, e.g., projections. In this paper, a multi-directional image projection transformation with fixed vector lengths (MDIPFL) is applied for one-shot recognition tasks, trained on Siamese and Triplet architectures. Results show, that MDIPFL based approach achieves decent performance, despite of the significantly lower number of parameters.

【 授权许可】

Unknown