Thermal Transitions in P3HT:PC60BM Films Based on Electrical Resistance Measurements

Polymers

Barbara Hajduk¹  Henryk Bednarski¹  Marian Domański¹  Bożena Jarząbek¹  Barbara Trzebicka¹ 

[1] Centre of Polymer and Carbon Materials, Polish Academy of Sciences, 34 Marie Curie-Skłodowska str., 41-819 Zabrze, Poland;

关键词: electrical resistance;    spectroscopic ellipsometry;    polymer films;    organic semiconductors;    ellipsometric modeling;   

DOI  :  10.3390/polym12071458

来源: DOAJ

【 摘 要 】

In this paper, we present research on thermal transition temperature determination in poly (3-hexylthiophene-2,5-diyl) (P3HT), [6,6]-phenyl-C61-butyric acid methyl ester (PC60BM), and their blends, which are materials that are conventionally used in organic optoelectronics. Here, for the first time the results of electrical resistance measurements are explored to detect thermal transitions temperatures, such as glass transition T_g and cold crystallization T_cc of the film. To confirm these results, the variable-temperature spectroscopic ellipsometry studies of the same samples were performed. The thermal transitions temperatures obtained with electrical measurements are well suited to phase diagram, constructed on the basis of ellipsometry in our previous work. The data presented here prove that electrical resistance measurements alone are sufficient for qualitative thermal analysis, which lead to the identification of characteristic temperatures in P3HT:PC60BM films. Based on the carried studies, it can be expected that the determination of thermal transition temperatures by means of electrical resistance measurements will also apply to other semi-conducting polymer films.

【 授权许可】

Unknown