期刊论文详细信息
Informacije MIDEM | |
Back Propagation Neural Network in Predicting the Thermal Fatigue Life of Microelectronic Chips | |
关键词: thermal fatigue, microelectronic chips, bp, singularity parameters, life prediction; | |
DOI : https://doi.org/10.33180/InfMIDEM2020.102 | |
来源: DOAJ |
【 授权许可】
Unknown