期刊论文详细信息
| Informacije MIDEM | |
| Back Propagation Neural Network in Predicting the Thermal Fatigue Life of Microelectronic Chips | |
| 关键词: thermal fatigue, microelectronic chips, bp, singularity parameters, life prediction; | |
| DOI : https://doi.org/10.33180/InfMIDEM2020.102 | |
| 来源: DOAJ | |
【 授权许可】
Unknown