Advances and prospects of genetic mapping of Verticillium wilt resistance in cotton

Journal of Cotton Research

Xinhui NIE¹  Peng HAN¹  Zhenyuan PAN¹  Abdulaziz Nuhu JIBRIL¹  Longfu ZHU¹  Nurimanguli AINI¹  Shiming LIU² 

[1] Key Laboratory of Oasis Ecology Agricultural of Xinjiang Bingtuan, Agricultural College, Shihezi University;National Key Laboratory of Crop Genetic Improvement, College of Plant Sciences and Technology, Huazhong Agricultural University;

关键词: Cotton Verticillium wilt;    Genetic mapping;    QTL;   

DOI  :  10.1186/s42397-021-00109-0

来源: DOAJ

【 摘 要 】

Abstract Verticillium wilt is one of the most important diseases affecting cotton production in China. The fungus, Verticillium dahliae, has a wide host range and a high degree of genetic variability. No resistance resources have been found in the available planting resources, thus presenting difficulties and challenges for our study. The long-term production practice shows that selection of disease-resistant varieties is the most economical and effective measure to control Verticillium wilt of cotton to reduce the yield loss and quality decline of cotton. In this paper, we summarized the genetic mapping population, the analysis method of genetic localization, the discovery, mining and cloning of disease-resistant quantitative trait loci/markers, and the analysis of their genetic functions, so as to provide information for the molecular breeding approach of disease-resistant cotton.

【 授权许可】

Unknown