A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe

Computation

George B. Kasapoglu¹  Evangelia A. Karagianni²  Christos Vazouras²  Nikolaos K. Uzunoglu³ 

[1] Department of Informatics and Telecommunication, National and Kapodistrian University of Athens, Panepistimiopolis, Ilisia, Athens 15784, Greece;Hellenic Naval Academy, Hatzikyriakou Ave., Piraeus 18539, Greece;School of Electrical and Computer Engineering, National Technical University of Athens, Zografou Campus, 9, Iroon Polytechniou Str., Zografou 15780, Greece;

关键词: non-destructive techniques;    microwaves;    horn antenna;    reflectometry;   

DOI  :  10.3390/computation6010012

来源: DOAJ

【 摘 要 】

A microwave free space reflectometry technique with swept frequency measurements for the profiling of wall structures and the detection of hidden (covered) layers has been applied to the Hagia Sophia byzantine monument. Experimental measurement results are presented and compared with three-dimensional (3D) simulated results, exhibiting fair agreement in some (though not all) aspects. Based on the experimental results, the possibility of clear discrimination between regions with and without covered mosaic layers, and hence the detection of such layers, is demonstrated.

【 授权许可】

Unknown