Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy

Advanced Science

Owoong Kwon¹  Daehee Seol¹  Yunseok Kim¹  Huimin Qiao¹ 

[1] School of Advanced Materials and Engineering & Research Center for Advanced Materials Technology Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea;

关键词: conductive atomic force microscopy;    ferroelectricity;    piezoelectricity;    piezoresponse force microscopy;    scanning probe microscopy;   

DOI  :  10.1002/advs.201901391

来源: DOAJ

【 摘 要 】

Abstract Piezoelectric and ferroelectric materials have garnered significant interest owing to their excellent physical properties and multiple potential applications. Accordingly, the need for evaluating piezoelectric and ferroelectric properties has also increased. The piezoelectric and ferroelectric properties are evaluated macroscopically using laser interferometers and polarization–electric field loop measurements. However, as the research focus is shifted from bulk to nanosized materials, scanning probe microscopy (SPM) techniques have been suggested as an alternative approach for evaluating piezoelectric and ferroelectric properties. In this Progress Report, the recent progress on the nanoscale evaluation of piezoelectric and ferroelectric properties of diverse materials using SPM‐based methods is summarized. Among the SPM techniques, the focus is on recent studies that are related to piezoresponse force microscopy and conductive atomic force microscopy; further, the utilization of these two modes to understand piezoelectric and ferroelectric properties at the nanoscale level is discussed. This work can provide guidelines for evaluating the piezoelectric and ferroelectric properties of materials based on SPM techniques.

【 授权许可】

Unknown