Effect of Spectral Power Distribution on the Resolution Enhancement in Surface Plasmon Resonance

Photonic Sensors

Guodong Wang¹  Cuixia Zhou¹  Shiqun Jin¹  Guo Xia¹ 

[1] Laboratory of Special Display Technology of the Ministry of Education, National Engineering Laboratory of Special Display Technology, National Key Laboratory of Advanced Display Technology, Academy of Photoelectric Technology, Hefei University of Technology;

关键词: Instrumentation;    measurement;    metrology;    surface plasmon;    resonance;   

DOI  :  10.1007/s13320-018-0507-8

来源: DOAJ

【 摘 要 】

Abstract For wavelength interrogation based surface plasmon resonance (SPR) sensors, refractive index (RI) resolution is an important parameter to evaluate the performance of the system. In this paper, we explore the influence of spectral power distribution on the refractive index (RI) resolution of the SPR system by simulating the reflectivity curve corresponding to the different incident angles of the classical Kretschmann structure and several different spectral power distribution curves. A wavelength interrogation based SPR system is built, and commercial micro-spectrometers (USB2000 and USB4000) are used as the detection components, respectively. The RI resolutions of the SPR system in these two cases are measured, respectively. Both theoretical and experimental results show that the spectral power distribution has a significant effect on the RI resolution of the SPR system.

【 授权许可】

Unknown