Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution

IEEE Photonics Journal

Xiong Li¹  Xiangang Luo¹  Changtao Wang¹  Mingbo Pu¹  Xiaoliang Ma¹  Weijie Kong¹ 

[1] State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China;

关键词: Fluorescence microscopy;    Photonic crystals;    Subwavelength structures;   

DOI  :  10.1109/JPHOT.2020.3044920

来源: DOAJ

【 摘 要 】

Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility.

【 授权许可】

Unknown