TEM sample preparation of microsized LiMn2O4 powder using an ion slicer

Applied Microscopy

Yoon-Jung Kang¹  Sun Eui Choi²  Yong Nam Jo²  Jung Sik Park³ 

[1] Industry University Cooperation Foundation, Hanyang University, 04763, Seoul, South Korea;Korea Electronics Technology Institute, 13509, Gyeonggi-do, South Korea;Product Application Support, JEOL Korea, 05355, Seoul, South Korea;

关键词: Ion slicer;    Lithium-ion secondary battery;    Backside-ion milling;    TEM sample preparation;    Broad argon-ion beam (BIB);    High-resolution (HR) STEM;   

DOI  :  10.1186/s42649-021-00068-5

来源: Springer

【 摘 要 】

The main purpose of this paper is the preparation of transmission electron microscopy (TEM) samples from the microsized powders of lithium-ion secondary batteries. To avoid artefacts during TEM sample preparation, the use of ion slicer milling for thinning and maintaining the intrinsic structure is described. Argon-ion milling techniques have been widely examined to make optimal specimens, thereby making TEM analysis more reliable. In the past few years, the correction of spherical aberration (Cs) in scanning transmission electron microscopy (STEM) has been developing rapidly, which results in direct observation at an atomic level resolution not only at a high acceleration voltage but also at a deaccelerated voltage. In particular, low-kV application has markedly increased, which requires a sufficiently transparent specimen without structural distortion during the sample preparation process. In this study, sample preparation for high-resolution STEM observation is accomplished, and investigations on the crystal integrity are carried out by Cs-corrected STEM.

【 授权许可】

CC BY