| Nanoscale Research Letters | |
| Advanced Atomic Layer Deposition Technologies for Micro-LEDs and VCSELs | |
| Dong-Sing Wuu1  Yen-Wei Yeh2  Po-Tsung Lee2  Tsung-Chi Hsu2  Hao-Chung Kuo3  Shouqiang Lai4  Su-Hui Lin4  Tingzhu Wu4  Zhong Chen4  Shui-Yang Lien5  Guisen Li6  | |
| [1] Department of Materials Science and Engineering, National Chung Hsing University, 40227, Taichung, Taiwan;Department of Photonics and Institute of Electro-Optical Engineering, College of Electrical and Computer Engineering, National Yang Ming Chiao Tung University, 30010, Hsinchu, Taiwan;Department of Photonics and Institute of Electro-Optical Engineering, College of Electrical and Computer Engineering, National Yang Ming Chiao Tung University, 30010, Hsinchu, Taiwan;Semiconductor Research Center, Hon Hai Research Institute, 11492, Taipei, Taiwan;Fujian Engineering Research Center for Solid-State Lighting, Xiamen University National Integrated Circuit Industry and Education Integration Innovation Platform, School of Electronic Science and Engineering, Xiamen University, 361005, Xiamen, China;School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, 361024, Xiamen, China;Unicompound Semiconductor Corporation, 351117, Putian, China; | |
| 关键词: ALD; Micro-LED; Passivation; VCSEL; Reliability; | |
| DOI : 10.1186/s11671-021-03623-x | |
| 来源: Springer | |
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【 摘 要 】
In recent years, the process requirements of nano-devices have led to the gradual reduction in the scale of semiconductor devices, and the consequent non-negligible sidewall defects caused by etching. Since plasma-enhanced chemical vapor deposition can no longer provide sufficient step coverage, the characteristics of atomic layer deposition ALD technology are used to solve this problem. ALD utilizes self-limiting interactions between the precursor gas and the substrate surface. When the reactive gas forms a single layer of chemical adsorbed on the substrate surface, no reaction occurs between them and the growth thickness can be controlled. At the Å level, it can provide good step coverage. In this study, recent research on the ALD passivation on micro-light-emitting diodes and vertical cavity surface emitting lasers was reviewed and compared. Several passivation methods were demonstrated to lead to enhanced light efficiency, reduced leakage, and improved reliability.
【 授权许可】
CC BY
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO202202175232657ZK.pdf | 2251KB |
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