| Nanotechnology Reviews | |
| Application of helium ion microscopy to nanostructured polymer materials | |
| article | |
| Valery N. Bliznyuk1  Dennis LaJeunesse2  Adam Boseman2  | |
| [1] Environmental Engineering and Earth Science, Clemson University;Department of Nanoscience, Joint School of Nanoscience and Nanoengineering, University of North Carolina Greensboro | |
| 关键词: biopolymers; helium ion microscopy; nanolithography; nanoporous polymers; polymer nanocomposites; polymer nanoparticles; | |
| DOI : 10.1515/ntrev-2014-0004 | |
| 学科分类:社会科学、人文和艺术(综合) | |
| 来源: De Gruyter | |
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【 摘 要 】
Helium ion microscopy (HIM) is a relatively new high-resolution nanotechnology imaging and nanofabrication tool. HIM offers a near-molecular resolution (approaching that of TEM) combined with a simplicity of sample preparation and high depth of field similar to SEM. Simultaneously, the technique is not limited by the surface roughness as scanning probe microscopy (SPM) techniques or by the surface charging or radiation damage like SEM. In our review, we consider general principles, advantages, and prospects of HIM application in polymer science. Examples of high-resolution imaging of polymer-based nanocomposites, polymer nanoparticles, nanofibers, nanoporous materials, polymer nanocrystals, biopolymers, and polymer-based photovoltaic and sensor devices are presented. We compare the HIM’s applicability with other modern imaging techniques: SPM and SEM.
【 授权许可】
CC BY
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO202107200004422ZK.pdf | 7647KB |
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