期刊论文详细信息
| Micro & nano letters | |
| Structural investigation of silicon nanowires with grazing incidence small angle X-ray scattering | |
| article | |
| Denis Buttard1  Tobias Schülli3  Fabrice Oehler1  Pascal Gentile1  | |
| [1] INAC/SiNaPS-MINATEC, CEA-Grenoble;Université Joseph Fourier/IUT-1;European Synchrotron Radiation Facility | |
| 关键词: elemental semiconductors; nanowires; silicon; X-ray scattering; structural investigation; silicon nanowires; grazing incidence small angle X-ray scattering; wire morphology; periodic fringes; asymptotic behaviour; scattering signal; size 50 nm; size 100 nm; size 200 nm; size 25 mum; Si; | |
| DOI : 10.1049/mnl.2013.0405 | |
| 学科分类:计算机科学(综合) | |
| 来源: Wiley | |
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【 摘 要 】
Studies have shown that stroke survivors are associated with physical as well as psychological symptoms. Spasticity is the main physical issue associated with stroke survivors and stress, anxiety, and depression are common. This study was conducted to investigate any effect of hypnosis on the psychological symptoms (anxiety, stress, and depression) and on the spasticity in the stroke survivors.
【 授权许可】
CC BY|CC BY-ND|CC BY-NC|CC BY-NC-ND
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO202107100004196ZK.pdf | 255KB |
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