| Materials Research | |
| Effects of Bias Voltage on Fen Films Prepared by Magnetron Sputtering | |
| Yuqiao Zeng1  Zheng Tan1  Lichu Zhou1  Meiya Jiang1  Yuedong Qiu1  Feng Fang1  Haibo Huang1  Xuhai Zhang1  Jianqing Jiang1  | |
| 关键词: thin film; iron nitride; magnetic sputtering; soft magnetic materials; microstructural characterization; | |
| DOI : 10.1590/1516-1439.334614 | |
| 来源: SciELO | |
PDF
|
|
【 摘 要 】
Iron nitride films were deposited by radio frequency (RF) reactive magnetron sputtering at different bias voltages. It was found that the composition, structure and magnetic properties of the iron nitride films were strongly dependent on the depositing bias voltage. With a bias voltage of –50 V, the iron nitride film is fully dense and has a homogenous microstructure consisting of α-Fe and Fe16N2, leading to a unique combination of high Ms of 1645 emu/cc, Hc of 5 Oe and μi of 1573.
【 授权许可】
CC BY
All the contents of this journal, except where otherwise noted, is licensed under a Creative Commons Attribution License
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO202005130153482ZK.pdf | 2007KB |
PDF