Quantitative trait loci associated with resistance to gray leaf spot and grain yield in corn

Ciência e Agrotecnologia

Adriano Delly Veiga²  Renzo Garcia Von Pinho²  Luciane Vilela Resende²  Édila Vilela De Resende Von Pinho²  Márcio Balestre¹  Laís Andrade Pereira¹ 

[1] ,Universidade Federal de Lavras Departamento de Agricultura Lavras MG ,Brasil

关键词: Maximum likelihood;    microsatellites;    regression;    Máxima verossimilhança;    microssatélites;    regressão;   

DOI  :  10.1590/S1413-70542012000100004

来源: SciELO

【 摘 要 】

The main objectives of hybrid development programs include incorporating genetic resistance to diseases and increasing grain yield. Identification of Quantitative Trait Loci (QTL) through the statistical analysis of molecular markers allows efficient selection of resistant and productive hybrids. The objective of this research was to identify QTL associated with resistance to gray leaf spot and for grain yield in the germplasm of tropical corn. We used two strains with different degrees of reaction to the disease; the genotypes are owned by GENESEEDS Ltda, their F1 hybrid and the F2 population. The plants were evaluated for gray leaf spot resistance, for grain yield and were genotyped with 94 microsatellite markers. Association of the markers with the QTL was performed by single marker analysis using linear regression and maximum likelihood analysis. It was observed that the additive effect was predominant for genetic control of resistance to gray leaf spot, and the dominant effect in that of grain yield. The most promising markers to be used in studies of assisted selection are: umc2082 in bins 4.03 and umc1117 in bins 4.04 for resistance to gray leaf spot; for grain yield umc1042 in bins 2.07 and umc1058 in bins 4.11.

【 授权许可】

CC BY   
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