Química Nova | |
Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento | |
F. Wypych2  Th. Weber1  R. Prins1  | |
[1] ,Universidade Federal do ParanáCuritiba PR | |
关键词: scanning tunnelling microscopy; tungsten disulphide; catalysis; | |
DOI : 10.1590/S0100-40421998000100001 | |
来源: SciELO | |
【 摘 要 】
Scanning tunnelling microscopy (STM) was used to characterise the basal surface of fresh cleaved crystals of 2H-WS2. Although no impurity or stacking faults could be detected by X-ray diffraction, STM images obtained with negative bias voltage showed two kinds of defects. These defects were attributed to an iodine derivative used as transport agent. In a flat surface free of defects, an image with atomic resolution was achieved with sulphur distances and angles as expected for hexagonal symmetry of 2H-WS2.
【 授权许可】
CC BY-NC
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